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JEDECLABORATORYSTANDARDField-Induced Charged-Device ModelTest Method for Electrostatic-Discharge-Withstand Thresholds ofMicroelectronic ComponentsJESD22-C101F(Revision of JESD22-C101E,December 2009)OCTOBER 2013JEDEC SOLID STATE TECHNOLOGY ASSOCIATIONJE五元Downloade球茶方式6品e8-号h80h°马391716567605 am PST
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