Surface-potential-manual操作说明书手册

Interleave Scanning and LiftModeInterleave is an advanced feature of NanoScope software that allows the simultaneous acquisition of two datatypes.Enabling Interleave alters the scan pattern of the piezo:after the trace and retrace of each main scanline (in which topography is typically measured),a second trace and retrace is inserted to obtain non-topographical information.The Interleave commands use a set of Interleave controls that allow several scan controls (Drive Amplitude,HYPERLINK "javascript:void(O);"),and various HYPERLINK "javascript:void(O);"})to be set independently of thosein the main scan controlsTypical applications of interleave scanning include HYPERLINK"file:///D:\Program%20Files\Nanoscope\8.15\Help\Icon\Content\Interleave%20Scanning\Magnetic%20Force%2OMicroscopy%20(MFM).htm"o "Link to Magnetic Force Microscopy(MFM)"}and HYPERLINK"file:///D:\Program%20Files\Nanoscope\8.15\Help\Icon\Content\Interleave%20Scanning\Electric%20Force%20Microscopy%20(EFM).htm"o"Link to Electric Force Microscopy (EFM)"}measurements.There are two forms ofInterleave scanning available:LiftModeEnabling Interleave with the mode set to Lift enacts LiftMode.During the interleave scan,the feedback isturned off and the tip is lifted to a user-selected height above the surface to perform far field measurementssuch as magnetic or electric forces.By recording the cantilever deflection or resonance shifts caused by themagnetic or electric forces on the tip,an image map of force changes can be produced.LiftMode wasdeveloped to isolate purely MFM and EFM data from topographic data.Interleave ModeInterleave can also be used in Interleave Mode.In this mode,the feedback is kept on while additionaltopography,phase lateral force,or data is acquired.How Interleave Mode WorksEnabling Interleave changes the scan pattern of the tip relative to the imaged area.With Interleave modedisabled,the tip scans back and forth in the fast scan direction while slowly moving in the orthogonal directionas shown on the left of figure 1,below.This is the standard scan pattern of NanoScope systems.